Integration or Stand-Alone?

It doesn’t matter if you decide for stand-alone or an integration, our product portfolio covers it. With the help of our powerful software and hardware, every PC can be transformed into a JTAG/Boundary Scan tester with extended fault coverage.

However, ready-made testers like JULIET include Unit Under Test (UUT) power supply and are preconfigured professional solutions for adapting the UUT.

As far as the analogue circuit parts are concerned, the highest possible fault coverage can be achieved by combining JTAG/Boundary Scan with other methodologies. Numerous integration packages of various performance classes are available for such purposes. Typically, they have been developed in close cooperation with, and are authorised, by the respective ATE vendor.

Increased Test Coverage by Integration on Other Test Methologies

• JTAG/Boundary Scan and Flying Probe: High flexibility without bed-of-nails for high-mix
• JTAG/Boundary Scan and Functional Test: High fault coverage also in dynamic domain
• JTAG/Boundary Scan and HASS/HALT: Dynamic monitoring for tests in environmental chamber
• JTAG/Boundary Scan and In-Circuit Test: High throughput with best diagnosis for high-volume
• JTAG/Boundary Scan and AOI: Assembly test and optoelectronic tests
• JTAG/Boundary Scan and Gang Test: Parallel programming and test of several boards

Stand-Alone and Integration Solutions – Flexibly defining Production Tests

Nowadays, testing is an important integral part of any quality assurance strategy. But each production environment and every product put different demands on the test equipment. We have consistently taken up this challenge and developed flexible system solutions, which adapt to the production process and can be integrated in existing environments without performance loss. Tests, already developed in the lab, can be directly taken over into the production process for fast New Product Introduction (NPI).

Perfectly Equipped by All Means with GOEPEL electronic's Integration Solutions

• Shortest test time and high-speed programming of Flash/PLD provide full in-line capability also at very high beat rate
• Detection, pin accurate diagnosis and layout display of all defects such as shorts or open BGA solder joints within one application
• Complete interaction of JTAG/Boundary Scan patterns with test vectors of other ATE or AOI systems for highest fault coverage
• Standard interface control via LabVIEW®,TestStand, C/C++, Basic, Tcl/Tck, Python etc. down to vector level
• Efficient system utilisation by means of Floating License, fast project transfer through archive files and online fault data tracing
• Availability of custom JTAG/Boundary Scan systems including adaptation based on platforms such as PXI or JULIET

JULIET (JTAG Unlimited Tester)

JULIET is suitable for the testing of small production batches and prototypes. All electronics are integrated inside the system. The system is based on exchangeable adaptors and can be quickly converted in a few steps to handle different projects.